AQT IBEX

Trapped-ion QPU accessed directly via qiskit-aqt-provider. Hardware access window: Tuesdays and Wednesdays 10:00–17:00 CET. Automated weekly runs began April 2026.

%
Latest run success rate
%
All-time mean
Runs (2026)
Total circuits

Consistency over time

Within-run consistency score (1 - std dev) — the primary stability metric. Higher is more consistent. Faded line and dots are individual runs; bold line and larger dots are the 4-run rolling average.

Success probability over time

Success probability for a given circuit is the fraction of shots that produced the correct output — where "correct" is the deterministic, noise-free answer computed by classical simulation. Each point is the mean across the circuits sampled that run. The bold line is the 4-run rolling average; faded line and dots are individual runs. The shaded band shows ±1 standard deviation within the run.

Performance breakdown

How success probability varies across circuit depth and input state, aggregated across all runs.

Success probability by circuit depth and input state

Each point is one (depth, input state) combination. Point size reflects how many circuits were run with that combination. Drag to rotate.

Distribution by circuit depth

Mean success by circuit depth

Mean success probability for each depth, averaged across all runs. A declining trend confirms that noise accumulates as circuit depth increases.

Mean success by input state

Does the initial qubit state affect results? Ideally it shouldn't — deviations suggest state-preparation or readout asymmetry.

Incidents

All runs